Invention Grant
- Patent Title: Inspection systems and methods of operation
- Patent Title (中): 检查系统和操作方法
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Application No.: US11502199Application Date: 2006-08-10
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Publication No.: US07389206B2Publication Date: 2008-06-17
- Inventor: Yuri Alexeyevich Plotnikov
- Applicant: Yuri Alexeyevich Plotnikov
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Penny A. Clarke; Patrick K. Patnode
- Main IPC: G06F15/00
- IPC: G06F15/00
Abstract:
A method for inspecting an object is provided. The method includes applying a pulsed excitation signal to the object and detecting a transient response signal to the pulsed excitation signal. The method also includes convolving the transient response signal with a plurality of orthogonal functions to generate a plurality of orthogonal components.
Public/Granted literature
- US20080040053A1 Inspection systems and methods of operation Public/Granted day:2008-02-14
Information query
