Invention Grant
- Patent Title: Probe for testing a device under test
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Application No.: US11888957Application Date: 2007-08-03
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Publication No.: US07394269B2Publication Date: 2008-07-01
- Inventor: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
- Applicant: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
- Applicant Address: US OR Beaverton
- Assignee: Cascade Microtech, Inc.
- Current Assignee: Cascade Microtech, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Chernoff, Vilhauer, McClung & Stenzel
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
Public/Granted literature
- US20070273399A1 Probe for testing a device under test Public/Granted day:2007-11-29
Information query
