发明授权
- 专利标题: Transmitted-light base for a microscope, and method for regulating the illumination intensity of a transmitted-light base
- 专利标题(中): 用于显微镜的透射光基底和用于调节透光基底的照射强度的方法
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申请号: US11286835申请日: 2005-11-23
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公开(公告)号: US07394593B2公开(公告)日: 2008-07-01
- 发明人: Ruedi Rottermann , Patrick Kopf , Otto Geschwentner , Klaus-Peter Zimmer
- 申请人: Ruedi Rottermann , Patrick Kopf , Otto Geschwentner , Klaus-Peter Zimmer
- 申请人地址: CH Heerbrugg
- 专利权人: Leica Microsystems (Schweiz) AG
- 当前专利权人: Leica Microsystems (Schweiz) AG
- 当前专利权人地址: CH Heerbrugg
- 代理机构: Simpson & Simpson, PLLC
- 优先权: DE102004056685 20041124
- 主分类号: G02B21/06
- IPC分类号: G02B21/06
摘要:
The invention relates to a transmitted-light base (1) for illuminating an object (15) for imaging through a zoom microscope (21), the transmitted-light base (1) comprising an integrated light source (3) having an associated electrical power regulation system (31) for generating a suitable radiation flux, and means (5, 6), capable of being added downstream, for generating a specified spectral intensity distribution. To allow compensation for brightness changes of low dynamic range, such as those occurring in particular during zooming, a continuously controllable mechanical brightness regulator (4) is proposed which is activatable by means of an associated adjustment device (41) in such a way that the illumination intensity of the transmitted-light base (1) is controllable with no change in the spectral intensity distribution. The brightness regulator (4) is arranged close to the light exit side of a reflector lamp (3) used as the light source, or, when a lamp (17) and collector lens (18) are used as the light source, close to the collector lens (18).
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