Invention Grant
- Patent Title: Plasma enhanced chemical vapor deposition method of forming titanium silicide comprising layers
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Application No.: US11394988Application Date: 2006-03-30
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Publication No.: US07396570B2Publication Date: 2008-07-08
- Inventor: Cem Basceri , Irina Vasilyeva , Ammar Derraa , Philip H. Campbell , Gurtej S. Sandhu
- Applicant: Cem Basceri , Irina Vasilyeva , Ammar Derraa , Philip H. Campbell , Gurtej S. Sandhu
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John, P.S.
- Main IPC: H01L21/4763
- IPC: H01L21/4763 ; H05H1/24

Abstract:
Chemical vapor deposition methods of forming titanium silicide including layers on substrates are disclosed. TiCl4 and at least one silane are first fed to the chamber at or above a first volumetric ratio of TiCl4 to silane for a first period of time. The ratio is sufficiently high to avoid measurable deposition of titanium silicide on the substrate. Alternately, no measurable silane is fed to the chamber for a first period of time. Regardless, after the first period, TiCl4 and at least one silane are fed to the chamber at or below a second volumetric ratio of TiCl4 to silane for a second period of time. If at least one silane was fed during the first period of time, the second volumetric ratio is lower than the first volumetric ratio. Regardless, the second feeding is effective to plasma enhance chemical vapor deposit a titanium silicide including layer on the substrate.
Public/Granted literature
- US20060172087A1 Plasma enhanced chemical vapor deposition method of forming titanium silicide comprising layers Public/Granted day:2006-08-03
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