发明授权
- 专利标题： Semiconductor with damage detection circuitry
- 专利标题（中）： 具有损坏检测电路的半导体
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申请号： US11237633申请日： 2005-09-28
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公开(公告)号： US07397103B2公开(公告)日： 2008-07-08
- 发明人: Vance D. Archer , Daniel P. Chesire , Seung H. Kang , Taeho Kook , Sailesh M. Merchant
- 申请人： Vance D. Archer , Daniel P. Chesire , Seung H. Kang , Taeho Kook , Sailesh M. Merchant
- 申请人地址： US PA Allentown
- 专利权人： Agere Systems, Inc.
- 当前专利权人： Agere Systems, Inc.
- 当前专利权人地址： US PA Allentown
- 主分类号： H01L23/485
- IPC分类号： H01L23/485
摘要：
Disclosed herein are novel damage detection circuitries implemented on the periphery of a semiconductor device. The circuitries disclosed herein enable the easy identification of cracks and deformation, and other types of damage that commonly occur during test and assembly processes of semiconductor devices.
公开/授权文献
- US20070069365A1 Semiconductor with damage detection circuitry 公开/授权日：2007-03-29
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