发明授权
US07403588B2 Method for production of tomographic slice images of an examination object using at least two X-ray beams at offset angles, and a computed tomography scanner for carrying out this method
有权
使用偏移角度的至少两个X射线束生成检查对象的断层图像的方法,以及用于执行该方法的计算机断层摄影扫描器
- 专利标题: Method for production of tomographic slice images of an examination object using at least two X-ray beams at offset angles, and a computed tomography scanner for carrying out this method
- 专利标题(中): 使用偏移角度的至少两个X射线束生成检查对象的断层图像的方法,以及用于执行该方法的计算机断层摄影扫描器
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申请号: US11213679申请日: 2005-08-30
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公开(公告)号: US07403588B2公开(公告)日: 2008-07-22
- 发明人: Herbert Bruder , Stefan Schaller
- 申请人: Herbert Bruder , Stefan Schaller
- 申请人地址: DE Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DE Munich
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: DE102004042491 20040831
- 主分类号: H05G1/60
- IPC分类号: H05G1/60
摘要:
A method is disclosed for production of tomographic slice images of an examination object using a computed tomography scanner. In order to scan an examination object, at least two X-ray beams are produced, which each are at offset angles and fan out from a focus to an opposite detector and scan the examination object. The scans at least partially overlap. Detector output data which is emitted from the detector elements is measured together with physical orientation data of the beams and is converted to projection data sets. Slice images are then calculated. In order to calculate the complete slice images, data which is redundant from the measured data of the at least two X-ray beams from overlapping projection intervals is used for each complete slice image. The size of the overlap area of the projection data used from the individual X-ray beams is defined before the calculation of the slice images, in order to vary time resolution and image quality.
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