Invention Grant
- Patent Title: Detection circuit for measurement of test lead and using the same
- Patent Title (中): 检测电路用于测量引线并使用它
-
Application No.: US11546920Application Date: 2006-10-13
-
Publication No.: US07408361B2Publication Date: 2008-08-05
- Inventor: James Wu , Larry Tsai , Winston Hsiao
- Applicant: James Wu , Larry Tsai , Winston Hsiao
- Applicant Address: TW Hsin-Tien Taipei
- Assignee: Escort Instruments Corporation
- Current Assignee: Escort Instruments Corporation
- Current Assignee Address: TW Hsin-Tien Taipei
- Agency: Birch Stewart Kolasch & Birch, LLP
- Priority: TW95125554A 20060712
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G01R31/04

Abstract:
A detecting method of a detecting circuit with a plugged test lead. The method includes setting an operation mode of the detecting circuit by a recognizing unit, transmitting a signal to the recognizing unit by an oscillating unit when the test lead plugs or unplugs into a split contact jack, receiving the signal from the oscillating unit by the recognizing unit, and determining a condition of the detecting circuit, and sending a message to a user in accordance with the determining result of the recognizing unit. Further, the oscillating unit is stopped from oscillating and outputs a quiescent state voltage to the recognizing unit when the plugged test lead is inserted into the split contact jack.
Public/Granted literature
- US20080088317A1 Detection circuit for measurement of test lead and using the same Public/Granted day:2008-04-17
Information query