Invention Grant
- Patent Title: Wavelength measuring device for a single light receiving element and wavelength measuring method at different temperatures
- Patent Title (中): 用于单个光接收元件的波长测量装置和不同温度下的波长测量方法
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Application No.: US10913541Application Date: 2004-08-09
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Publication No.: US07411178B2Publication Date: 2008-08-12
- Inventor: Haruyoshi Ono
- Applicant: Haruyoshi Ono
- Applicant Address: JP Yamanashi
- Assignee: Eudyna Devices Inc.
- Current Assignee: Eudyna Devices Inc.
- Current Assignee Address: JP Yamanashi
- Agency: Westerman, Hattori, Daniels & Adrian, LLP.
- Priority: JP2003-207222 20030811
- Main IPC: H01J7/24
- IPC: H01J7/24 ; G01J3/46
Abstract:
A wavelength measuring device includes: a light receiving element that receive light to be measured; a temperature controller that maintains the light receiving element at different temperatures; and a calculation unit that determines the wavelength of the light to be measured, based on the outputs of the light receiving elements.
Public/Granted literature
- US20050035272A1 Wavelength measuring device, light receiving unit, and wavelength measuring method Public/Granted day:2005-02-17
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