发明授权
- 专利标题： Systems and methods for analyzing an abnormality of an object
- 专利标题（中）： 用于分析物体异常的系统和方法
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申请号： US10611296申请日： 2003-07-01
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公开(公告)号： US07412280B2公开(公告)日： 2008-08-12
- 发明人: Sarah Rose Hertel , Stanley H. Fox , Alexander Ganin , Charles William Stearns
- 申请人： Sarah Rose Hertel , Stanley H. Fox , Alexander Ganin , Charles William Stearns
- 申请人地址： US WI Waukesha
- 专利权人： GE Medical Systems Global Technology Company, LLC
- 当前专利权人： GE Medical Systems Global Technology Company, LLC
- 当前专利权人地址： US WI Waukesha
- 代理机构： Small Patent Law Group
- 代理商 Dean D. Small
- 主分类号： A61B5/05
- IPC分类号： A61B5/05 ; A61B6/00
摘要：
In one embodiment, a method for analyzing at least one abnormality of an object is described. The method includes obtaining a first image containing an abnormality using a first modality, obtaining a second image containing the abnormality using a second modality, selecting a first region of interest located within the first image, determining an anatomical size of the abnormality based on the first region of interest in the first image, and determining a relative metabolic activity based on a second region of interest within the second image.
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