发明授权
- 专利标题: Waveform measuring apparatus and method thereof
- 专利标题(中): 波形测量装置及其方法
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申请号: US11566838申请日: 2006-12-05
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公开(公告)号: US07414387B2公开(公告)日: 2008-08-19
- 发明人: Tomoaki Kimura , Tadayuki Okada
- 申请人: Tomoaki Kimura , Tadayuki Okada
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Shimokaji & Associates, P.C.
- 优先权: JP2005-351037 20051205
- 主分类号: G01R23/16
- IPC分类号: G01R23/16 ; G01D1/14
摘要:
A waveform measuring apparatus includes: a digital filter for removing a large-amplitude changing component from an input signal and for outputting a resultant output signal with a small-amplitude noise component left therein; a window generating section for receiving a differential signal between this input signal and the resultant output signal of the digital filter and for generating a window indicating a position of an edge portion of the differential signal; and a ringing measurement section for extracting, from the resultant output signal of the digital filter, a portion of waveform which is indicated by the window generated by the window generating section and for measuring at least a peak-to-peak amplitude of the portion of waveform.
公开/授权文献
- US20070126412A1 WAVEFORM MEASURING APPARATUS AND METHOD THEREOF 公开/授权日:2007-06-07
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