Invention Grant
- Patent Title: Relay testing system and method
- Patent Title (中): 继电器测试系统及方法
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Application No.: US11776347Application Date: 2007-07-11
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Publication No.: US07415377B2Publication Date: 2008-08-19
- Inventor: Aaron C. Klijn , Marvin G. Miller , Francisco J. Pataro , Michael D. Willett , Michael Edwards , Terry L. Elzy , Michael Maahs , John L. Shanks , Stanley I. Thompson
- Applicant: Aaron C. Klijn , Marvin G. Miller , Francisco J. Pataro , Michael D. Willett , Michael Edwards , Terry L. Elzy , Michael Maahs , John L. Shanks , Stanley I. Thompson
- Applicant Address: US TX Dallas
- Assignee: AVO Multi-Amp Corporation DBA Megger
- Current Assignee: AVO Multi-Amp Corporation DBA Megger
- Current Assignee Address: US TX Dallas
- Agency: Conley Rose, P.C.
- Agent J. Robert Brown, Jr.
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored in the memory location. The first program supports relay testing. The device includes a versioned program to support relay testing, and a processor in communication with the signal generator and the memory location. The device also includes a routine that is operable by the processor to install a versioned program in the memory location replacing the first program.
Public/Granted literature
- US20070257680A1 Relay Testing System and Method Public/Granted day:2007-11-08
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