Invention Grant
US07420361B2 Method for improving stability and lock time for synchronous circuits
有权
提高同步电路稳定性和锁定时间的方法
- Patent Title: Method for improving stability and lock time for synchronous circuits
- Patent Title (中): 提高同步电路稳定性和锁定时间的方法
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Application No.: US11519556Application Date: 2006-09-12
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Publication No.: US07420361B2Publication Date: 2008-09-02
- Inventor: Feng Lin , J. Brian Johnson
- Applicant: Feng Lin , J. Brian Johnson
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: G01R13/02
- IPC: G01R13/02

Abstract:
Delay-locked loops, signal locking methods and devices and systems incorporating delay-locked loops are described. A delay-locked loop includes a forward delay path, a feedback delay path, a phase detector and a timer circuit. The forward delay path alternatively couples to an external clock signal and to an internal test signal. The phase detector adjusts a delay line based upon the phase differences of a feedback signal and the external clock signal. The timer circuit switches the internal test signal into the forward delay path and measures the time of traversal of the internal test signal around the forward delay path and the feedback delay path and generates a time constant for configuring the phase detector's update period. The phase detector is thereafter able to stabilize at an improved rate.
Public/Granted literature
- US20070007941A1 Apparatus for improving stability and lock time for synchronous circuits Public/Granted day:2007-01-11
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