发明授权
US07420361B2 Method for improving stability and lock time for synchronous circuits
有权
提高同步电路稳定性和锁定时间的方法
- 专利标题: Method for improving stability and lock time for synchronous circuits
- 专利标题(中): 提高同步电路稳定性和锁定时间的方法
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申请号: US11519556申请日: 2006-09-12
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公开(公告)号: US07420361B2公开(公告)日: 2008-09-02
- 发明人: Feng Lin , J. Brian Johnson
- 申请人: Feng Lin , J. Brian Johnson
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: TraskBritt
- 主分类号: G01R13/02
- IPC分类号: G01R13/02
摘要:
Delay-locked loops, signal locking methods and devices and systems incorporating delay-locked loops are described. A delay-locked loop includes a forward delay path, a feedback delay path, a phase detector and a timer circuit. The forward delay path alternatively couples to an external clock signal and to an internal test signal. The phase detector adjusts a delay line based upon the phase differences of a feedback signal and the external clock signal. The timer circuit switches the internal test signal into the forward delay path and measures the time of traversal of the internal test signal around the forward delay path and the feedback delay path and generates a time constant for configuring the phase detector's update period. The phase detector is thereafter able to stabilize at an improved rate.
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