Invention Grant
- Patent Title: Device manufacturing method and lithographic apparatus
- Patent Title (中): 器件制造方法和光刻设备
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Application No.: US11654037Application Date: 2007-01-17
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Publication No.: US07426015B2Publication Date: 2008-09-16
- Inventor: Hendricus Johannes Maria Meijer , Michael Jozef Mathijs Renkens
- Applicant: Hendricus Johannes Maria Meijer , Michael Jozef Mathijs Renkens
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman, LLP
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03B27/54

Abstract:
A device manufacturing method includes bringing pressure within a vacuum chamber of a lithographic projection apparatus to a temperature stabilizing pressure range; keeping the pressure within the vacuum chamber within the temperature stabilizing pressure range for a period of time so as to stabilize the temperature in the vacuum chamber; decreasing the pressure within the vacuum chamber to a production pressure range; generating a beam of radiation with a radiation system; patterning the beam of radiation; and projecting the patterned beam of radiation through the vacuum chamber onto a target portion of a layer of radiation-sensitive material on a substrate.
Public/Granted literature
- US20080170210A1 DEVICE MANUFACTURING METHOD AND LITHOGRAPHIC APPARATUS Public/Granted day:2008-07-17
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