发明授权
- 专利标题: Alignment of substrates for bonding
- 专利标题(中): 用于接合的基板的对准
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申请号: US11412112申请日: 2006-04-27
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公开(公告)号: US07433038B2公开(公告)日: 2008-10-07
- 发明人: Franciscus Godefridus Casper Bijnen , Roy Werkman
- 申请人: Franciscus Godefridus Casper Bijnen , Roy Werkman
- 申请人地址: NL Veldhoven
- 专利权人: ASML Netherlands B.V.
- 当前专利权人: ASML Netherlands B.V.
- 当前专利权人地址: NL Veldhoven
- 代理机构: Pillsbury Winthrop Shaw Pittman, LLP
- 主分类号: G01B11/00
- IPC分类号: G01B11/00 ; H01L21/30
摘要:
An alignment apparatus for a substrate bonding system is provided with a first optical arm arranged to direct onto a detector radiation from a first alignment mark on a first substrate, and a second optical arm arranged to direct onto the detector radiation from a second alignment mark on a second substrate. The first alignment mark has a known location relative to a functional pattern provided on an opposite side of the first substrate, and the second alignment mark has a known location relative to a functional pattern provided on an opposite side of the second substrate. The substrate bonding system can be further provided with first and second substrate tables arranged to hold the first and second substrates such that they face one another, at least one of the substrate tables being movable in response to a signal output from the detector, thereby allowing the first and second substrates to be aligned with respect to each other for bonding.
公开/授权文献
- US20070252994A1 Alignment of substrates for bonding 公开/授权日:2007-11-01
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