Invention Grant
- Patent Title: Edge detection and correcting system and method
- Patent Title (中): 边缘检测和校正系统及方法
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Application No.: US10951301Application Date: 2004-09-27
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Publication No.: US07433086B2Publication Date: 2008-10-07
- Inventor: James Vradenburg Miller , Paulo Ricardo Dos Santos Mendonca , Matthew William Turek , Dirk Ryan Padfield
- Applicant: James Vradenburg Miller , Paulo Ricardo Dos Santos Mendonca , Matthew William Turek , Dirk Ryan Padfield
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Jason K. Klindtworth
- Main IPC: H04N1/40
- IPC: H04N1/40
Abstract:
An imaging system for correcting a bias in the location edges in an image is provided. The imaging system comprises an image processor configured to detect edges in an image of a given substructure, characterize a blurring factor in the image and correct a bias in the detected edges in the of a given substructure using the blurring factor.
Public/Granted literature
- US20060066911A1 Edge detection and correcting system and method Public/Granted day:2006-03-30
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