Invention Grant
- Patent Title: Method of manufacturing a magnetic detection apparatus
- Patent Title (中): 磁性检测装置的制造方法
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Application No.: US11536106Application Date: 2006-09-28
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Publication No.: US07441322B2Publication Date: 2008-10-28
- Inventor: Izuru Shinjo , Shigeki Tsujii , Yoshinori Tatenuma , Hiroshi Sakanoue , Masahiro Yokotani , Ryouichi Sasahara
- Applicant: Izuru Shinjo , Shigeki Tsujii , Yoshinori Tatenuma , Hiroshi Sakanoue , Masahiro Yokotani , Ryouichi Sasahara
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Denki Kabushiki Kaisha
- Current Assignee: Mitsubishi Denki Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2003-280313 20030725
- Main IPC: G01R3/00
- IPC: G01R3/00

Abstract:
A magnetic detection apparatus can be improved in its product yield. The magnetic detection apparatus includes a resin compact having a the magnet arranged in opposition to an object to be detected for generating a magnetic field, an IC chip with a magnetic detection part built therein for detecting a change in the magnetic field in accordance with movement of the object to be detected, and an IC package in which a lead frame having the IC chip installed thereon is sealed with a resin. A method for manufacturing such a magnetic detection apparatus includes a signal adjustment step for adjusting a signal generated from the magnetic detection part in a state in which the magnetic field is applied to the magnetic detection part to correct a deviation of the signal of the magnetic detection part generated in accordance with a relative displacement between the magnetic detection part and the magnet.
Public/Granted literature
- US20070163104A1 MAGNETIC DETECTION APPARATUS AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2007-07-19
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