发明授权
US07443635B2 Magnetic detector including antiferromagnetic layer, amorphous barrier layer, base layer, and hard layer arranged in that order and method for manufacturing magnetic detector
失效
磁性检测器，包括反铁磁性层，非晶形阻挡层，基层，以及按顺序布置的硬质层以及用于制造磁检测器的方法
- 专利标题： Magnetic detector including antiferromagnetic layer, amorphous barrier layer, base layer, and hard layer arranged in that order and method for manufacturing magnetic detector
- 专利标题（中）： 磁性检测器，包括反铁磁性层，非晶形阻挡层，基层，以及按顺序布置的硬质层以及用于制造磁检测器的方法
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申请号： US11249751申请日： 2005-10-04
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公开(公告)号： US07443635B2公开(公告)日： 2008-10-28
- 发明人: Kenichi Tanaka , Eiji Umetsu , Masahiro Oshima , Naoya Hasegawa
- 申请人： Kenichi Tanaka , Eiji Umetsu , Masahiro Oshima , Naoya Hasegawa
- 申请人地址： JP Tokyo
- 专利权人： Alps Electric Co., Ltd.
- 当前专利权人： Alps Electric Co., Ltd.
- 当前专利权人地址： JP Tokyo
- 代理机构： Brinks Hofer Gilson & Lione
- 优先权： JP2004-297229 20041012
- 主分类号： G11B5/39
- IPC分类号： G11B5/39
摘要：
A multilayer film is placed on a subatrate. The multilayer film includes an antiferromagnetic layer, a pinned magnetic layer, a non-magnetic material layer, and a free magnetic layer. The multilayer film has recessed sections arranged in both side regions thereof, the recessed sections being formed by partly removing the multilayer film in a vacuum. The bottoms of the recessed sections are located between the upper face and lower face of the antiferromagnetic layer. Amorphous barrier layers with a thickness of Å are placed on the bottoms of the recessed sections, the amorphous barrier layers being formed in the same vacuum as that for forming the recessed sections sequentially to the step of forming the recessed sections.
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