发明授权
US07443707B2 Magnetic random access memory array with free layer locking mechanism and method of its use
失效
磁性随机存取存储阵列具有自由层锁定机制及其使用方法
- 专利标题: Magnetic random access memory array with free layer locking mechanism and method of its use
- 专利标题(中): 磁性随机存取存储阵列具有自由层锁定机制及其使用方法
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申请号: US11732073申请日: 2007-04-02
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公开(公告)号: US07443707B2公开(公告)日: 2008-10-28
- 发明人: Yimin Guo , Po-Kang Wang , Xizeng Shi , Tai Min
- 申请人: Yimin Guo , Po-Kang Wang , Xizeng Shi , Tai Min
- 申请人地址: US CA Milpitas US CA Milpitas
- 专利权人: Headway Technologies, Inc.,Applied Spintronics, Inc.
- 当前专利权人: Headway Technologies, Inc.,Applied Spintronics, Inc.
- 当前专利权人地址: US CA Milpitas US CA Milpitas
- 代理机构: Saile Ackerman LLC
- 代理商 Stephen B. Ackerman
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
A method of using an MTJ MRAM cell element having two magnetization states of greater and lesser stability. During switching, the free layer is first placed in the less stable state by a word line current, so that a small bit line current can switch its magnetization direction. After switching, the state reverts to its more stable form as a result of magnetostatic interaction with a SAL (soft adjacent layer), which is a layer of soft magnetic material formed on an adjacent current carrying line, which prevents it from being accidentally rewritten when it is not actually selected and also provides stability against thermal agitation.
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