发明授权
US07443945B2 Method for scattered radiation correction in the case of an X-ray CT, and X-ray CT for applying this method
有权
在X射线CT的情况下用于散射辐射校正的方法,以及用于应用该方法的X射线CT
- 专利标题: Method for scattered radiation correction in the case of an X-ray CT, and X-ray CT for applying this method
- 专利标题(中): 在X射线CT的情况下用于散射辐射校正的方法,以及用于应用该方法的X射线CT
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申请号: US11790709申请日: 2007-04-27
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公开(公告)号: US07443945B2公开(公告)日: 2008-10-28
- 发明人: Herbert Bruder , Karl Stierstorfer
- 申请人: Herbert Bruder , Karl Stierstorfer
- 申请人地址: DE Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DE Munich
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: DE102006019923 20060428
- 主分类号: A61B6/00
- IPC分类号: A61B6/00
摘要:
It is proposed to estimate the scattered radiation on the basis of a sinogram, which is measured in any case. In at least one embodiment, a method includes determining the potential scattering site for each measuring beam from the object tangents in the sinogram and calculating the scattered intensity from the primary radiation striking the scattering site and the angle ratios of scattering beam, object tangent and measuring beam. Also proposed, in at least one embodiment, is an X-ray CT having at least bifocal detector systems and a control and computer unit for producing tomographic pictures, the control and arithmetic unit of which contains a program code that, upon being executed, carries out the method.