Invention Grant
- Patent Title: Vacuum ultra-violet reflectometer with stray light correction
- Patent Title (中): 真空紫外线反射计,带杂散光校正
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Application No.: US11517894Application Date: 2006-09-08
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Publication No.: US07446876B2Publication Date: 2008-11-04
- Inventor: Dale A. Harrison
- Applicant: Dale A. Harrison
- Applicant Address: US TX Austin
- Assignee: MetroSol Inc.
- Current Assignee: MetroSol Inc.
- Current Assignee Address: US TX Austin
- Agency: O'Keefe, Egan, Peterman & Enders, LLP
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized. Array based detection instrumentation may be exploited to permit the simultaneous collection of larger wavelength regions.
Public/Granted literature
- US20070030488A1 Broad band referencing reflectometer Public/Granted day:2007-02-08
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