发明授权
US07452825B2 Method of forming a mask structure and method of forming a minute pattern using the same
有权
形成掩模结构的方法和使用其形成微小图案的方法
- 专利标题: Method of forming a mask structure and method of forming a minute pattern using the same
- 专利标题(中): 形成掩模结构的方法和使用其形成微小图案的方法
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申请号: US11589372申请日: 2006-10-30
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公开(公告)号: US07452825B2公开(公告)日: 2008-11-18
- 发明人: Doo-Youl Lee , Han-Ku Cho , Suk-Joo Lee , Gi-Sung Yeo , Cha-Won Koh , Sung-Gon Jung
- 申请人: Doo-Youl Lee , Han-Ku Cho , Suk-Joo Lee , Gi-Sung Yeo , Cha-Won Koh , Sung-Gon Jung
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel Sibley & Sajovec, P.A.
- 优先权: KR10-2006-0082119 20060829
- 主分类号: H01L21/44
- IPC分类号: H01L21/44 ; H01L21/00
摘要:
In the method of forming a mask structure, a first mask is formed on a substrate where the first mask includes a first mask pattern having a plurality of mask pattern portions having openings therebetween and a second mask pattern having a corner portion of which an inner side wall that is curved. A sacrificial layer is formed on the first mask. A hard mask layer is formed on the sacrificial layer. After the hard mask layer is partially removed until the sacrificial layer adjacent to the corner portion is exposed, a second mask is formed from the hard mask layer remaining in the space after removing the sacrificial layer. A minute pattern having a fine structure may be easily formed on the substrate.
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