发明授权
US07460410B2 Nonvolatile semiconductor memory device and programming or erasing method therefor
有权
非易失性半导体存储器件及其编程或擦除方法
- 专利标题: Nonvolatile semiconductor memory device and programming or erasing method therefor
- 专利标题(中): 非易失性半导体存储器件及其编程或擦除方法
-
申请号: US11502430申请日: 2006-08-11
-
公开(公告)号: US07460410B2公开(公告)日: 2008-12-02
- 发明人: Hiroyasu Nagai , Masahiro Toki , Kenji Misumi , Hideto Kotani
- 申请人: Hiroyasu Nagai , Masahiro Toki , Kenji Misumi , Hideto Kotani
- 申请人地址: JP Osaka
- 专利权人: Panasonic Corporation
- 当前专利权人: Panasonic Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP2005-253239 20050901
- 主分类号: G11C16/00
- IPC分类号: G11C16/00
摘要:
In a nonvolatile memory cell having a trap layer, programming or erasing is made in a sequence of first charge injection with a given wait time being secured and second charge injection executed after the first charge injection. Surrounding charge that deteriorates the data retention characteristic is reduced by use of initial variation occurring immediately after programming (charge loss phenomenon due to binding of injected charge with the surrounding charge in an extremely short time), and then the charge loss due to the initial variation is compensated, to thereby improve the data retention characteristic.
公开/授权文献
信息查询