发明授权
US07460410B2 Nonvolatile semiconductor memory device and programming or erasing method therefor 有权
非易失性半导体存储器件及其编程或擦除方法

Nonvolatile semiconductor memory device and programming or erasing method therefor
摘要:
In a nonvolatile memory cell having a trap layer, programming or erasing is made in a sequence of first charge injection with a given wait time being secured and second charge injection executed after the first charge injection. Surrounding charge that deteriorates the data retention characteristic is reduced by use of initial variation occurring immediately after programming (charge loss phenomenon due to binding of injected charge with the surrounding charge in an extremely short time), and then the charge loss due to the initial variation is compensated, to thereby improve the data retention characteristic.
信息查询
0/0