Invention Grant
- Patent Title: Bipolar transistor and fabricating method thereof
- Patent Title (中): 双极晶体管及其制造方法
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Application No.: US11411840Application Date: 2006-04-27
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Publication No.: US07465638B2Publication Date: 2008-12-16
- Inventor: Kye-Won Maeng , Sung-Ryoul Bae , Dong-Kyun Nam , Tae-Jin Kim
- Applicant: Kye-Won Maeng , Sung-Ryoul Bae , Dong-Kyun Nam , Tae-Jin Kim
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2005-0036005 20050429
- Main IPC: H01L21/331
- IPC: H01L21/331 ; H01L29/70

Abstract:
There is provided a bipolar transistor (with a respective fabrication method) that provides superior noise characteristics and gain diffusion. The fabricating method includes forming a first base region at a collector region, which in turn is formed on a substrate. A first silicon layer is formed on the base region, and a second silicon layer is formed on the first silicon layer using a forming method different from the method used in forming the first silicon layer. An emitter region is then formed from impurities at the base region by performing a thermal process.
Public/Granted literature
- US20060252214A1 Bipolar transistor and fabricating method thereof Public/Granted day:2006-11-09
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