Invention Grant
- Patent Title: Calibration mechanism of a scanning device
- Patent Title (中): 扫描装置的校准机制
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Application No.: US11518703Application Date: 2006-09-11
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Publication No.: US07466458B2Publication Date: 2008-12-16
- Inventor: Sung-Po Cheng
- Applicant: Sung-Po Cheng
- Applicant Address: TW
- Assignee: Avision Inc.
- Current Assignee: Avision Inc.
- Current Assignee Address: TW
- Priority: TW94131251A 20050912
- Main IPC: H04N1/40
- IPC: H04N1/40 ; H04N1/04

Abstract:
A calibration mechanism of a scanning device including an assembly of a flexible member and a calibration strip and a limiting member is disclosed. The assembly of the flexible member and the calibration strip can travel in reciprocating motion, and the limiting member limits the distance of the vertical drift of the calibration strip. Thus, the calibration strip is confined within an anticipated position, and the accuracy and the consistency of the calibration results for an optical module of the scanner, which acquires image data of a plurality of the-scanning lines of the calibration strip, are greatly improved.
Public/Granted literature
- US20070070457A1 Calibration mechanism of a scanning device Public/Granted day:2007-03-29
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