Invention Grant
US07474414B2 System and method of guiding real-time inspection using 3D scanners
有权
使用3D扫描仪指导实时检测的系统和方法
- Patent Title: System and method of guiding real-time inspection using 3D scanners
- Patent Title (中): 使用3D扫描仪指导实时检测的系统和方法
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Application No.: US11284180Application Date: 2005-11-21
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Publication No.: US07474414B2Publication Date: 2009-01-06
- Inventor: Seock Hoon Bae , Tae Joo Kim
- Applicant: Seock Hoon Bae , Tae Joo Kim
- Applicant Address: KR
- Assignee: Inus Technology, Inc.
- Current Assignee: Inus Technology, Inc.
- Current Assignee Address: KR
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2005-0046859 20050601
- Main IPC: G01B11/24
- IPC: G01B11/24

Abstract:
A system and a method of guiding a real-time inspection using a 3D scanner are provided. The system and the method of guiding a real-time inspection using a 3D scanner allow an operator to perform an accurate and swift inspection of an object to be measured so as to meet a designer's design intentions. For that purpose, 3D shape information of an object to be measured is detected using a scanner and shape information and inspection guide information of the object stored in a data storage unit, and inspection information of the object for judging the validity of the measurement information detected from the scanner is checked through a display unit. After that, the scanner is operated to compare the measurement information detected by the scanner with the inspection information so as to judge the validity of the measurement. Therefore, an operator can accurately understand a designer's intentions for inspection to perform measurement.
Public/Granted literature
- US20060274327A1 System and method of guiding real-time inspection using 3D scanners Public/Granted day:2006-12-07
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