发明授权
US07476976B2 Flip chip package with advanced electrical and thermal properties for high current designs
有权
倒装芯片封装具有先进的电气和热性能,适用于高电流设计
- 专利标题: Flip chip package with advanced electrical and thermal properties for high current designs
- 专利标题(中): 倒装芯片封装具有先进的电气和热性能,适用于高电流设计
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申请号: US11358668申请日: 2006-02-21
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公开(公告)号: US07476976B2公开(公告)日: 2009-01-13
- 发明人: Bernhard P. Lange , Anthony L. Coyle
- 申请人: Bernhard P. Lange , Anthony L. Coyle
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 Yingsheng Tung; Wade J. Brady, III; Frederick J. Telecky, Jr.
- 主分类号: H01L23/52
- IPC分类号: H01L23/52 ; H01L23/34
摘要:
A QFN package and method of making same is provided comprising a substrate having a metal line extending from a connection element on a perimeter region of the substrate to a high current contact pad on interior region of the substrate. A semiconductor chip having an active surface generally faces the interior region of the substrate, wherein a heat-dissipating patterned metal distribution layer is formed over the active surface and electrically connected to an active component thereon. A solder strip electrically and thermally connects the high current contact pad and the metal distribution layer, and a mold compound generally encapsulates the semiconductor chip. The solder strip is generally uniform in depth and surface area, wherein low electrical resistance and inductance is provided between the high current contact pad and the metal distribution layer. An integrated heat sink may be further formed or placed on a passive surface of the chip.
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