发明授权
- 专利标题: Multiple angle of incidence spectroscopic scatterometer system
- 专利标题(中): 多重入射光谱散射仪系统
-
申请号: US11078572申请日: 2005-03-11
-
公开(公告)号: US07483133B2公开(公告)日: 2009-01-27
- 发明人: Noah Bareket , Haiming Wang
- 申请人: Noah Bareket , Haiming Wang
- 申请人地址: US CA Milpitas
- 专利权人: KLA-Tencor Technologies Corporation.
- 当前专利权人: KLA-Tencor Technologies Corporation.
- 当前专利权人地址: US CA Milpitas
- 代理机构: Weaver Austin Villeneuve & Sampson LLP
- 主分类号: G01J3/28
- IPC分类号: G01J3/28 ; G01J3/42 ; G01J3/427 ; G01B11/14 ; G01B11/04 ; G01B11/08
摘要:
Techniques for optimizing the sensitivity of spectroscopic measurement techniques with respect to certain profile variables by selecting desired measurement angles since the measurement sensitivity to each variable depends, at least in part, on the measurement angles of an incident beam. The selected desired set of measurement angles includes both an azimuth angle and a polar angle. Optimizing the sensitivity of spectroscopic measurement techniques can also reduce or eliminates measurement correlation among variable to be measured.
公开/授权文献
信息查询