发明授权
US07483133B2 Multiple angle of incidence spectroscopic scatterometer system 有权
多重入射光谱散射仪系统

Multiple angle of incidence spectroscopic scatterometer system
摘要:
Techniques for optimizing the sensitivity of spectroscopic measurement techniques with respect to certain profile variables by selecting desired measurement angles since the measurement sensitivity to each variable depends, at least in part, on the measurement angles of an incident beam. The selected desired set of measurement angles includes both an azimuth angle and a polar angle. Optimizing the sensitivity of spectroscopic measurement techniques can also reduce or eliminates measurement correlation among variable to be measured.
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