Invention Grant
- Patent Title: Source of x-rays
- Patent Title (中): X光源
-
Application No.: US11411131Application Date: 2006-04-26
-
Publication No.: US07492868B2Publication Date: 2009-02-17
- Inventor: Jonathan Gorrell , Mark Davidson
- Applicant: Jonathan Gorrell , Mark Davidson
- Applicant Address: VG St. Thomas
- Assignee: Virgin Islands Microsystems, Inc.
- Current Assignee: Virgin Islands Microsystems, Inc.
- Current Assignee Address: VG St. Thomas
- Agency: Davidson Berquist Jackson & Gowdey, LLP
- Main IPC: G21G4/04
- IPC: G21G4/04 ; H01J23/18 ; H05H7/22

Abstract:
A charged particle beam including charged particles (e.g., electrons) is generated from a charged particle source (e.g., a cathode or scanning electron beam). As the beam is projected, it passes between plural alternating electric fields. The attraction of the charged particles to their oppositely charged fields accelerates the charged particles, thereby increasing their velocities in the corresponding (positive or negative) direction. The charged particles therefore follow an oscillating trajectory. When the electric fields are selected to produce oscillating trajectories having the same (or nearly the same) as a multiple of the frequency of the emitted x-rays, the resulting photons can be made to constructively interfere with each other to produce a coherent x-ray source.
Public/Granted literature
- US20070253535A1 Source of x-rays Public/Granted day:2007-11-01
Information query