Invention Grant
US07498848B2 System and method for monitoring clock signal in an integrated circuit
有权
用于监控集成电路中的时钟信号的系统和方法
- Patent Title: System and method for monitoring clock signal in an integrated circuit
- Patent Title (中): 用于监控集成电路中的时钟信号的系统和方法
-
Application No.: US11851380Application Date: 2007-09-06
-
Publication No.: US07498848B2Publication Date: 2009-03-03
- Inventor: Sanjay Kumar Wadhwa , Amit Kumar Srivastava
- Applicant: Sanjay Kumar Wadhwa , Amit Kumar Srivastava
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Charles Bergere
- Priority: IN2170/DEL/2006 20061003
- Main IPC: H03K5/19
- IPC: H03K5/19

Abstract:
A clock monitor system for monitoring an input clock signal in an integrated circuit (IC) includes a clock failure detection circuit and a delay circuit. The clock failure detection circuit generates a control signal based on the input clock signal. The delay circuit is connected to the clock failure detection circuit and provides a clock status signal based on the control signal. The clock status signal indicates whether the input clock signal is operating correctly. The delay circuit provides the clock status signal to the IC after a predetermined number of input clock cycles.
Public/Granted literature
- US20080079463A1 SYSTEM AND METHOD FOR MONITORING CLOCK SIGNAL IN AN INTEGRATED CIRCUIT Public/Granted day:2008-04-03
Information query
IPC分类: