Invention Grant
- Patent Title: Shielded probe for testing a device under test
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Application No.: US11975471Application Date: 2007-10-19
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Publication No.: US07501842B2Publication Date: 2009-03-10
- Inventor: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
- Applicant: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
- Applicant Address: US OR Beaverton
- Assignee: Cascade Microtech, Inc.
- Current Assignee: Cascade Microtech, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Chernoff, Vilhauer, McClung & Stenzel
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.
Public/Granted literature
- US20080042671A1 Probe for testing a device under test Public/Granted day:2008-02-21
Information query
