发明授权
- 专利标题: Automated atomic system testing
- 专利标题(中): 自动原子系统测试
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申请号: US11225360申请日: 2005-09-13
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公开(公告)号: US07506211B2公开(公告)日: 2009-03-17
- 发明人: Laura Ioana Apostoloiu , Philip Arthur Day , Behrad Ghazizadeh
- 申请人: Laura Ioana Apostoloiu , Philip Arthur Day , Behrad Ghazizadeh
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Carey Rodriguez Greenberg & Paul LLP
- 代理商 Willy D. A. Rose, Esq.; Steven M. Greenberg, Esq.
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
Atomic testing of a multiplicity of scenarios includes generating a listing of interacting scenarios which are likely to cause a failure, and testing ones of the scenarios not included in the listing according to a binary search strategy to identify a subset of the scenarios as a source of failure among the scenarios. Additionally, the listing can be updated with newly identified interacting scenarios which are likely to cause a failure.
公开/授权文献
- US20070061624A1 Automated atomic system testing 公开/授权日:2007-03-15
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