Invention Grant
US07514800B2 Semiconductor device and wire bonding method therefor 有权
半导体装置及其引线接合方法

  • Patent Title: Semiconductor device and wire bonding method therefor
  • Patent Title (中): 半导体装置及其引线接合方法
  • Application No.: US10194142
    Application Date: 2002-07-12
  • Publication No.: US07514800B2
    Publication Date: 2009-04-07
  • Inventor: Tsuyoshi Kida
  • Applicant: Tsuyoshi Kida
  • Applicant Address: JP Kanagawa
  • Assignee: NEC Electronics Corporation
  • Current Assignee: NEC Electronics Corporation
  • Current Assignee Address: JP Kanagawa
  • Agent Darryl G. Walker
  • Priority: JP2001-214954 20010716
  • Main IPC: H01L23/48
  • IPC: H01L23/48
Semiconductor device and wire bonding method therefor
Abstract:
A semiconductor device (10) that may have a wire bonding structure having reduced interference between bond wires and a path of a capillary has been disclosed. Semiconductor device (10) may include bond pads (12) arranged in a line along an edge of a semiconductor chip (14) and conductive fingers (16) arranged on a substrate (18). Bond pads (12) may be electrically connected to conductive fingers (16) with bond wires (20). Bond wires (20) may be divided into a first group having a relatively short length and a second group having a relatively long length. The bond wires (20) in the first group may have bonding points on a bonding pad (12) that is closer to an edge of semiconductor chip (14) than bonding points of bond wires (20) in the second group. In this way, spacing between bond wires (20) already formed and a capillary forming an adjacent bond wire may be increased.
Public/Granted literature
Information query
Patent Agency Ranking
0/0