Invention Grant
- Patent Title: Advanced electromagnetic location of electronic equipment
- Patent Title (中): 电子设备先进的电磁位置
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Application No.: US11252373Application Date: 2005-10-18
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Publication No.: US07515094B2Publication Date: 2009-04-07
- Inventor: Walter J. Keller, III
- Applicant: Walter J. Keller, III
- Applicant Address: US PA Charleroi
- Assignee: Nokomis, Inc.
- Current Assignee: Nokomis, Inc.
- Current Assignee Address: US PA Charleroi
- Agency: James Ray & Associates
- Main IPC: G01S13/74
- IPC: G01S13/74 ; G01S13/76 ; G01S13/79 ; G01S13/88 ; G01S13/00

Abstract:
An apparatus for measuring at least one of unintentional and intentional electromagnetic emissions for at least one of enabling electromagnetic location of predetermined electronic equipment giving off such at least one of such unintentional and intentional electromagnetic emissions, tagging such predetermined electronic equipment and tracking such predetermined electronic equipment and various combination thereof. The apparatus comprises an emitter mechanism for providing an amplified electromagnetic energy which at least one of amplifies and changes a frequency content of the at least one of such unintentional and intentional electromagnetic emissions signature of a targeted electronic device by using an applied electromagnetic field generated by the emitter mechanism. There is a receiver for receiving the at least one of such unintentional and intentional electromagnetic emissions signature of such targeted electronic device.
Public/Granted literature
- US20060082488A1 Advanced electromagnetic location of electronic equipment Public/Granted day:2006-04-20
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