Invention Grant
- Patent Title: Reflection-testing device and method for use thereof
- Patent Title (中): 反射测试装置及其使用方法
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Application No.: US11644256Application Date: 2006-12-21
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Publication No.: US07515254B2Publication Date: 2009-04-07
- Inventor: Ching-Lung Jao
- Applicant: Ching-Lung Jao
- Applicant Address: TW Chu-Nan, Miao-Li Hsien
- Assignee: Altus Technology Inc.
- Current Assignee: Altus Technology Inc.
- Current Assignee Address: TW Chu-Nan, Miao-Li Hsien
- Agent Steven M. Reiss
- Priority: CN200610060235 20060407
- Main IPC: G01B9/00
- IPC: G01B9/00
Abstract:
A reflection-testing device for testing for unwanted reflections in a lens module (12) includes a plurality of light sources (18) and an image capturer (16). The plurality of light sources is provided around the top end of the lens module, and the image capturer is provided near the other end of the lens module for receiving optical signals through the lens module. A lens reflection testing method is also disclosed.
Public/Granted literature
- US20070236683A1 Reflection-testing device and method for use thereof Public/Granted day:2007-10-11
Information query
