发明授权
- 专利标题: X-ray measuring instrument
- 专利标题(中): X射线测量仪
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申请号: US11722802申请日: 2005-12-08
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公开(公告)号: US07515689B2公开(公告)日: 2009-04-07
- 发明人: Rika Baba , Ken Ueda
- 申请人: Rika Baba , Ken Ueda
- 申请人地址: JP Tokyo
- 专利权人: Hitachi Medical Corporation
- 当前专利权人: Hitachi Medical Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout & Kraus, LLP.
- 优先权: JP2005-019285 20050127
- 国际申请: PCT/JP2005/022522 WO 20051208
- 国际公布: WO2006/080144 WO 20060803
- 主分类号: G21K3/00
- IPC分类号: G21K3/00
摘要:
An X-ray measuring instrument in which an object under examination is irradiated with X-rays, measurement data on the object is detected, a filter for adjusting the amount of transmitted X-rays is disposed between an X-ray source and the object, the relative position of the X-ray source to the object is varied, and the acquired measurement data is computed. The measurement data is subjected to logarithm transform to acquire projection data, and the amount of absorbed X-rays of the filter corresponding to the acquired projection data is determined. The thickness of the filter is computed by using a predetermined transform formula for the acquired amount of absorbed X-rays. A correction coefficient corresponding to the projection data acquired from the computed thickness of the filter is determined, and the projection data is multiplied by the determined correction coefficient. The projection data multiplied by the correction coefficient is restructure-computed to obtain a three-dimensional image.
公开/授权文献
- US20080043900A1 X-Ray Measuring Instrument 公开/授权日:2008-02-21
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