Invention Grant
- Patent Title: Calibration method for a parallel kinematic mechanism machine
- Patent Title (中): 平行运动机构的校准方法
-
Application No.: US11413490Application Date: 2006-04-28
-
Publication No.: US07520156B2Publication Date: 2009-04-21
- Inventor: Tetsuya Matsushita
- Applicant: Tetsuya Matsushita
- Applicant Address: JP Niwa-gun
- Assignee: Okuma Corporation
- Current Assignee: Okuma Corporation
- Current Assignee Address: JP Niwa-gun
- Agency: Burr & Brown
- Priority: JP2005-143175 20050516
- Main IPC: G01B3/30
- IPC: G01B3/30

Abstract:
Kinematic parameters of a parallel kinematic machine can be estimated with high precision considering thermal displacement and error of a measuring device, in addition to deformation error caused by self-weight of each component. A DBB device is used when end effectors of a parallel kinematic mechanism machine are positioned at plural positions and in plural postures. In the DBB device, a plurality of support bars are provided with rigid balls on the both ends. One of the balls is fixed on a table and the other ball is provided with an end effector. The position, posture, and distance from a fixed position are measured and based on the measured value kinematic parameters are estimated. In estimating the kinematic parameters, any of deformation error caused by self-weight of each component, thermal displacement of each component, error of a measuring device are added for computation by linear approximation.
Public/Granted literature
- US20060254364A1 Calibration method for a parallel kinematic mechanism machine Public/Granted day:2006-11-16
Information query