发明授权
- 专利标题: Semiconductor substrate, manufacturing method therefor, and semiconductor device
- 专利标题(中): 半导体衬底及其制造方法和半导体器件
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申请号: US10852511申请日: 2004-05-25
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公开(公告)号: US07525154B2公开(公告)日: 2009-04-28
- 发明人: Hajime Nagano , Ichiro Mizushima , Kiyotaka Miyano
- 申请人: Hajime Nagano , Ichiro Mizushima , Kiyotaka Miyano
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- 优先权: JP2004-074969 20040316
- 主分类号: H01L29/72
- IPC分类号: H01L29/72
摘要:
A semiconductor substrate and a manufacturing method therefore, and a semiconductor device using the semiconductor substrate comprise a strained Si region and unstrained Si region formed at substantially the same level. In an aspect of the invention, a semiconductor substrate is provided by comprising a support substrate, a first semiconductor region including a first silicon layer formed above the support substrate, a second semiconductor region including a strained second silicon layer formed above the support substrate, a surface of the second silicon layer being formed at substantially the same level as a surface of the first silicon layer, and an insulating film at an interface between the first semiconductor region and the second semiconductor region.
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