Invention Grant
- Patent Title: System and method for testing RFID devices
- Patent Title (中): RFID设备测试系统和方法
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Application No.: US11702712Application Date: 2007-02-05
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Publication No.: US07528712B2Publication Date: 2009-05-05
- Inventor: Min-Kao Hong , Hsin-Teng Lin , Shao-Wei Chung , Yu-Ying Huang , Jen-Chao Lu , Li-Huei Chen
- Applicant: Min-Kao Hong , Hsin-Teng Lin , Shao-Wei Chung , Yu-Ying Huang , Jen-Chao Lu , Li-Huei Chen
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Alston & Bird LLP
- Main IPC: G08B29/00
- IPC: G08B29/00
Abstract:
A system for testing RFID devices is introduced. The system includes a carrier plate configured for carrying an RFID device, a cable configured for supporting the carrier plate, a pulley apparatus configured for transporting the carrier plate along the cable, and a controller configured for adjusting test parameters in testing the RFID device.
Public/Granted literature
- US20070279212A1 System and method for testing RFID devices Public/Granted day:2007-12-06
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