发明授权
- 专利标题: Chemical mechanical polishing apparatus
- 专利标题(中): 化学机械抛光装置
-
申请号: US11905625申请日: 2007-10-02
-
公开(公告)号: US07534166B2公开(公告)日: 2009-05-19
- 发明人: Tomotake Morita
- 申请人: Tomotake Morita
- 申请人地址: JP Kawasaki, Kanagawa
- 专利权人: NEC Electronics Corporation
- 当前专利权人: NEC Electronics Corporation
- 当前专利权人地址: JP Kawasaki, Kanagawa
- 代理机构: McGinn IP Law Group, PLLC
- 优先权: JP2006-271582 20060310
- 主分类号: B24B29/00
- IPC分类号: B24B29/00
摘要:
An edge section of a wafer can be polished, and at same time, a polishing surface of a polishing member can be dressed by a dresser mechanism. A polishing member has annular concave trenches, which are coaxially formed in the front surface thereof, and at least an inner surface of the concave trenches is composed of an inclined polishing surface for polishing an edge section of the wafer, and a wafer pressing mechanism presses the edge section of the wafer against the inner surfaces in at least one side of the concave trench of the polishing member, and a dresser mechanism dresses at least the inner surfaces in at least one side of the concave trench of the polishing member.
公开/授权文献
- US20080153400A1 Chemical mechanical polishing apparatus 公开/授权日:2008-06-26
信息查询