Invention Grant
US07535390B2 Time-interleaved analog-to-digital converter and self-calibration method thereof 有权
时间交织的模数转换器及其自校准方法

  • Patent Title: Time-interleaved analog-to-digital converter and self-calibration method thereof
  • Patent Title (中): 时间交织的模数转换器及其自校准方法
  • Application No.: US12017348
    Application Date: 2008-01-22
  • Publication No.: US07535390B2
    Publication Date: 2009-05-19
  • Inventor: Cheng-Chung Hsu
  • Applicant: Cheng-Chung Hsu
  • Applicant Address: TW Science Park, HsinChu
  • Assignee: Realtek Semiconductor Corp.
  • Current Assignee: Realtek Semiconductor Corp.
  • Current Assignee Address: TW Science Park, HsinChu
  • Agent Winston Hsu
  • Priority: TW96102318A 20070122
  • Main IPC: H03M1/06
  • IPC: H03M1/06
Time-interleaved analog-to-digital converter and self-calibration method thereof
Abstract:
The present invention discloses a time-interleaved analog-to-digital converter (ADC), which includes a first and a second sub-ADC and a calibration module. The calibration module includes a switch module and a calibration engine. The switch module selectively provides one of a set of reference voltage levels, which are provided by a resistor series of the first sub-ADC, onto an input signal line, which is shared by the first and the second sub-ADCs. The calibration engine calibrates pre-amplifying units of the first and the second sub-ADCs according to digital signals generated by the first and the second sub-ADCs.
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