发明授权
- 专利标题: Method of microscopically examining a spatial finestructure
- 专利标题(中): 显微镜检查空间结构的方法
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申请号: US11861405申请日: 2007-09-26
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公开(公告)号: US07538893B2公开(公告)日: 2009-05-26
- 发明人: Stefan Hell , Volker Westphal , Norbert Quaas
- 申请人: Stefan Hell , Volker Westphal , Norbert Quaas
- 申请人地址: DE München
- 专利权人: Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
- 当前专利权人: Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
- 当前专利权人地址: DE München
- 代理机构: Thomas, Kayden, Horstemeyer & Risley, LLP
- 主分类号: G01B11/24
- IPC分类号: G01B11/24
摘要:
A method of microscopically examining a spatial fine structure comprises the steps of selecting a luminophore from the group of luminophores which have two physical states, the two states differing from each other with regard to the luminescence properties displayed by the luminophore, and which are reversibly, but essentially completely transferable out of one into the other state of their two states by means of an optical signal; overlaying a surface of the spatial fine structure with the luminophore; and determining the profile of the surface overlaid with the luminophore. The step of determining the profile of the surface comprises the sub-steps of transferring the luminophore by means of the optical signal out of the one into the other of its two states outside a presently observed measurement point, measuring luminescence light emitted by the luminophore, and repeating the sub-steps of transferring and measuring for further measurement points distributed over the surface.
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