发明授权
US07541136B2 Mask, manufacturing method for mask, and manufacturing method for semiconductor device 失效
掩模,掩模的制造方法和半导体器件的制造方法

Mask, manufacturing method for mask, and manufacturing method for semiconductor device
摘要:
Disclosed is a mask comprising a first area including a first surrounding area in which a halftone phase shift film or a stacked film of a halftone phase shift film and an opaque film is provided on a transparent substrate, and a first opening area surrounded by the first surrounding area, and a second area including a second surrounding area in which a halftone phase shift film is provided on the transparent substrate and a second opening area surrounded by the second surrounding area, wherein a transparent film is provided in at least a part of the second opening area, the transparent film being configured to give a predetermined phase difference to exposure light passing through that part of the second opening area in which the transparent film is provided relative to exposure light passing through the second surrounding area.
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