发明授权
- 专利标题: Method and apparatus of electromagnetic measurement
- 专利标题(中): 电磁测量方法和装置
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申请号: US11482063申请日: 2006-07-07
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公开(公告)号: US07541818B2公开(公告)日: 2009-06-02
- 发明人: Hirofumi Kosaka , Kazuhiko Ikeda , Shoichi Kajiwara , Hiroyuki Tani , Yoichiro Ueda , Atsushi Yamamoto
- 申请人: Hirofumi Kosaka , Kazuhiko Ikeda , Shoichi Kajiwara , Hiroyuki Tani , Yoichiro Ueda , Atsushi Yamamoto
- 申请人地址: JP Osaka
- 专利权人: Panasonic Corporation
- 当前专利权人: Panasonic Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: Steptoe & Johnson LLP
- 优先权: JP2005-198441 20050707; JP2005-358366 20051213
- 主分类号: G01R31/302
- IPC分类号: G01R31/302
摘要:
In order to direct a probe having directivity that a received band is widened in accordance with a measurement distance, toward a DUT, shift the received band of the probe in sequence, receive electromagnetic, and measure electromagnetic interference, a plurality of long and short measurement distances between the probe and the DUT are set, and measurement at the long measurement distance and measurement at the short measurement distance are performed plural times. Herein, the measurement at the short measurement distance is performed on a received band where electromagnetic interference is measured by the measurement at the long measurement distance. Thus, measurement of electromagnetic interference can be performed with high accuracy in a short time.
公开/授权文献
- US20070024293A1 Method and apparatus of electromagnetic measurement 公开/授权日:2007-02-01
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