发明授权
- 专利标题: Method of using SNR to reduce factory test time
- 专利标题(中): 使用SNR降低工厂测试时间的方法
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申请号: US11066240申请日: 2005-02-25
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公开(公告)号: US07542764B2公开(公告)日: 2009-06-02
- 发明人: Xin Jin , Jennifer Mallalieu , Qingzhong Jiao , Ronald Bruce Harding
- 申请人: Xin Jin , Jennifer Mallalieu , Qingzhong Jiao , Ronald Bruce Harding
- 申请人地址: CA Waterloo, Ontario
- 专利权人: Research in Motion Limited
- 当前专利权人: Research in Motion Limited
- 当前专利权人地址: CA Waterloo, Ontario
- 代理机构: Cassan Maclean
- 主分类号: H04Q7/20
- IPC分类号: H04Q7/20
摘要:
The application relates to wireless networks and more particularly to a method of reducing factory test time of receiver sensitivity in a Code Division Multiple Access (CDMA) wireless device. Under TIA/EIA/-98E, the radio frequency (RF) sensitivity of a CDMA wireless receiver is the minimum received power, measured at the mobile station antenna connector, at which the frame error rate (FER) does not exceed 0.5% with 95% confidence. In order to reduce the test time of FER test method, the relation between correlated energy (or Ec/Io) and FER is determined using simulated traffic and the correlated energy (or Ec/Io) measurement is then used as the test parameter on like models to achieve the same or superior test confidence with significantly reduced test time.
公开/授权文献
- US20060194552A1 Method of using SNR to reduce factory test time 公开/授权日:2006-08-31
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