Invention Grant
- Patent Title: Sensor self-test transfer standard
- Patent Title (中): 传感器自检传输标准
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Application No.: US11461599Application Date: 2006-08-01
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Publication No.: US07543473B2Publication Date: 2009-06-09
- Inventor: Howard Samuels
- Applicant: Howard Samuels
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Bromberg & Sunstein LLP
- Main IPC: G01P21/00
- IPC: G01P21/00

Abstract:
A system, computer program product and method of obtaining a performance parameter associated with a sensor, such as an accelerometer, is provided. The method includes applying an acceleration to the accelerometer and a first frequency to obtain a sensitivity of the accelerometer at the first frequency. A first self-test is performed on the accelerometer. The first self-test includes stimulating the accelerometer with a first self-test stimulation signal encoded with the first frequency, such that the accelerometer outputs a first signal. A self-test equivalent acceleration is then determined based, at least in part, on the first signal and the accelerometer sensitivity at the first frequency. A second self-test is performed on the accelerometer. The second self-test includes stimulating the accelerometer with a second self-test stimulation signal encoded with the second frequency, such that the accelerometer outputs a second signal. A parameter of the accelerometer is determined at the second frequency based, at least in part, on the second signal and the self-test equivalent acceleration. The parameter may be sensitivity of the accelerometer at the second frequency.
Public/Granted literature
- US20080028823A1 Sensor Self-Test Transfer Standard Public/Granted day:2008-02-07
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