发明授权
- 专利标题: Tandem type mass analysis system and method
- 专利标题(中): 串联式质量分析系统及方法
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申请号: US11624248申请日: 2007-01-18
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公开(公告)号: US07544930B2公开(公告)日: 2009-06-09
- 发明人: Kiyomi Yoshinari , Yasushi Terui , Toshiyuki Yokosuka , Kinya Kobayashi , Atsumu Hirabayashi
- 申请人: Kiyomi Yoshinari , Yasushi Terui , Toshiyuki Yokosuka , Kinya Kobayashi , Atsumu Hirabayashi
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout & Kraus, LLP.
- 优先权: JP2006-038461 20060215
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
The present invention provides a tandem type mass analysis system capable of carrying out the differential analysis with high efficiency by the tandem type mass analysis. A predetermined number of m/z regions are set up for carrying out the mass analysis with the all ions included therein being dissociated collectively for each m/z region so as to obtain measurement MS2 data. By comparing the measurement MS2 data with reference MS2 data stored in a reference data base, a difference thereof is detected. For the m/z region with a differential component detected, the mass analysis is carried out collectively without dissociation for the all ions included therein so as to obtain measurement MS1 data. By comparing the measurement MS1 data with the reference MS1 data, a difference thereof is detected. From the difference thereof, a parent ion considered to be the differential component factor is presumed for carrying out the mass analysis with the same being dissociated.
公开/授权文献
- US20070187588A1 TANDEM TYPE MASS ANALYSIS SYSTEM AND METHOD 公开/授权日:2007-08-16