Invention Grant
- Patent Title: Scatter attenuation tomography
- Patent Title (中): 散射衰减层析成像
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Application No.: US11843185Application Date: 2007-08-22
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Publication No.: US07551718B2Publication Date: 2009-06-23
- Inventor: Peter J. Rothschild
- Applicant: Peter J. Rothschild
- Applicant Address: US MA Billerica
- Assignee: American Science and Engineering, Inc.
- Current Assignee: American Science and Engineering, Inc.
- Current Assignee Address: US MA Billerica
- Agency: Bromberg & Sunstein LLP
- Main IPC: G01N23/201
- IPC: G01N23/201

Abstract:
Methods for characterizing an inspected object on the basis of attenuation determined from pair-wise illuminated voxels. A beam of penetrating radiation characterized by a propagation direction and an energy distribution is scanned across an object, while scatter detectors with collimated fields-of-view detect radiation scattered by each voxel of the inspected object that is intercepted by the incident beam of penetrating radiation. By calculating the attenuation of penetrating radiation between pairs of voxels of incidence of the incident beam, a tomographic image is obtained characterizing the three-dimensional distribution of attenuation in the object of one or more energies of penetrating radiation, and thus of various material characteristics.
Public/Granted literature
- US20080049899A1 Scatter Attenuation Tomography Public/Granted day:2008-02-28
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