发明授权
US07551721B2 X-ray diagnostic apparatus, image processing apparatus, and program
有权
X射线诊断装置,图像处理装置和程序
- 专利标题: X-ray diagnostic apparatus, image processing apparatus, and program
- 专利标题(中): X射线诊断装置,图像处理装置和程序
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申请号: US11676885申请日: 2007-02-20
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公开(公告)号: US07551721B2公开(公告)日: 2009-06-23
- 发明人: Takeshi Nakaura , Satoru Ohishi
- 申请人: Takeshi Nakaura , Satoru Ohishi
- 申请人地址: JP Kumamoto-shi JP Otawara-shi
- 专利权人: Takeshi Nakaura,Toshiba Medical Systems Corporation
- 当前专利权人: Takeshi Nakaura,Toshiba Medical Systems Corporation
- 当前专利权人地址: JP Kumamoto-shi JP Otawara-shi
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- 优先权: JP2006-042665 20060220
- 主分类号: A61B6/00
- IPC分类号: A61B6/00
摘要:
An X-ray diagnostic apparatus includes an image generating unit which generates a plurality of X-ray images by repeatedly radiographing a subject before and after injection of a contrast medium, a region detecting unit which detects a non-contrast region from a plurality of mask images before injection of the contrast medium and a plurality of contrast images after injection of the contrast medium, which constitute the plurality of X-ray images, a mask selecting unit which separately selects one mask image with respect to each of the contrast images on the basis of a correlation between the contrast image and the mask image upon localization to the non-contrast region, and a subtraction processing unit which generates a subtraction image by performing subtraction between the contrast image and the selected mask image.
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