Invention Grant
- Patent Title: Light scanning microscope and use
- Patent Title (中): 光扫描显微镜和使用
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Application No.: US10967638Application Date: 2004-10-19
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Publication No.: US07561326B2Publication Date: 2009-07-14
- Inventor: Joerg-Michael Funk , Ralf Wolleschensky , Joerg Steinert
- Applicant: Joerg-Michael Funk , Ralf Wolleschensky , Joerg Steinert
- Applicant Address: DE Jena
- Assignee: Carl Zeiss MicroImaging GmbH
- Current Assignee: Carl Zeiss MicroImaging GmbH
- Current Assignee Address: DE Jena
- Agency: Jacobson Holman PLLC
- Priority: DE102004034970 20040716
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B21/06

Abstract:
In a confocal laser scanning microscope with an illuminating configuration (2), which provides an illuminating beam for illuminating a specimen region (23), with a scanning configuration (3, 4), which guides the illuminating beam over the specimen while scanning, and with a detector configuration (5), which via the scanning configuration (3, 4) images the illuminated specimen region (23) by means of a confocal aperture (26) on to at least one detector unit (28), it is provided that the illuminating configuration (2) of the scanning configuration (3, 4) provides a line-shaped illuminating beam, that the scanning configuration (3, 4) guides the line-shaped illuminating beam over the specimen f while scanning and that the confocal aperture is designed as a slit aperture (26) or as a slit-shaped region (28, 48) of the detector unit (28) acting as a confocal aperture.
Public/Granted literature
- US20060012871A1 Light scanning electron microscope and use Public/Granted day:2006-01-19
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