发明授权
- 专利标题: Method for detecting component placement errors in product assembly and assemblies made therewith
- 专利标题(中): 用于检测产品组装和组件中组件放置误差的方法
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申请号: US11433021申请日: 2006-05-11
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公开(公告)号: US07562809B2公开(公告)日: 2009-07-21
- 发明人: Janet Bee Yin Chua , Eit Thian Yap
- 申请人: Janet Bee Yin Chua , Eit Thian Yap
- 申请人地址: SG Singapore
- 专利权人: Avago Technologies ECBU IP (Singapore) Pte. Ltd.
- 当前专利权人: Avago Technologies ECBU IP (Singapore) Pte. Ltd.
- 当前专利权人地址: SG Singapore
- 主分类号: G06F17/00
- IPC分类号: G06F17/00
摘要:
An article and a method for testing the assembly of that article are disclosed. The article includes a plurality of modules, at least two of the modules are capable of being placed in two different positions in the article, each module having a correct position in the article. Each module includes an aperture at a location determined by the desired position for that module in the article. The apertures are placed such that the apertures will be aligned to form a transparent channel when the modules are arranged in a predetermined pattern with respect to one another, but not when arranged in any of the possible incorrect orders. The article can be tested for assembly errors by transmitting a test light signal into the first end and testing for light that traversed all of said first transparent channel.
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